Document Type
Article
Department
Physics
Publication Date
2013
Abstract
By utilizing a nanometer ultrafast electron source in a point projection microscope we demonstrate that images of nanoparticles with spatial resolutions of the order of 100 nanometers can be obtained. The duration of the emission process of the photoemitted electrons used to make images is shown to be of the order of 100 fs using an autocorrelation technique. The compact geometry of this photoelectron point projection microscope does not preclude its use as a simple ultrafast electron microscope, and we use simple analytic models to estimate temporal resolutions that can be expected when using it as a pump-probe ultrafast electron microscope. These models show a significant increase in temporal resolution when comparing to ultrafast electron microscopes based on conventional designs. We also model the microscopes spectroscopic abilities to capture ultrafast phenomena such as the photon induced near field effect.
Comments
Quinonez is Trinity class of 2014, Handali, class of 2013.
Originally published as:
Erik Quinonez ’14, Jonathan Handali ’13, and Brett Barwick. “Femtosecond Photoelectron Point Projection Microscope.” Review of Scientific Instruments 84 (2013): 103710. Available online: http://dx.doi.org/10.1063/1.4827035
Reproduced in the Trinity College Digital Repository according to the publisher's distribution policies.